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High Vacuum Atomic Force Microscope
AFM LAB – MEB 1361A
Our AFM has optical access to the AFM tip through a reflective optical path composing of an off-axis parabolic and elliptic mirror. This enables scanning thermal microscopy (SThM), scattering-type near-field scanning optical microscopy (s-NSOM), nanoscale infrared (IR) spectroscopy, photoconductive atomic force microscopy (pc-AFM), and photo-induced force microscopy (PiFM).